Raman Studies in Chemically Synthesized Nanocrystalline CuS Thin Films
| Authors | Narayani M. Gosavi1, T.R. Wagh2, K.R. Sali2, S.R. Gosavi2 |
| Affiliations |
1Department of Applied Science, Govt. College of Engineering, Aurangabad-431005, (M. S.), India 2Material Research Laboratory, C.H.C. Arts, S.G.P. Commerce and B.B.J.P. Science College, Taloda, Dist-Nandurbar, 425413 (M.S.) India |
| Е-mail | srgosavi.taloda@gmail.com |
| Issue | Volume 16, Year 2024, Number 6 |
| Dates | Received 17 August 2024; revised manuscript received 16 December 2024; published online 23 December 2024 |
| Citation | Narayani M. Gosavi, T.R. Wagh, K.R. Sali, et al., J. Nano- Electron. Phys. 16 No 6, 06028 (2024) |
| DOI | https://doi.org/10.21272/jnep.16(6).06028 |
| PACS Number(s) | 61.82.Rx, 73.61. – r, 81.16.Be, 87.64.Bx, 87.64.kp |
| Keywords | Nanocrystalline (9) , Thin film (101) , Chemical synthesis (5) , XRD (95) , FESEM (9) , Raman spectra (6) . |
| Annotation |
This paper describes the chemical synthesis of nanocrystalline CuS thin films onto glass substrate at 40 C. The effect of the deposition time on the Raman spectroscopy results and physical properties was investigated. X-ray diffraction pattern showed the amorphous nature of CuS thin films deposited with deposition time of 20 min and transferred to orthorhombic crystal structure for CuS thin films with deposition time of 40 min. Raman modes observed at around 273 cm – 1 and 475 cm – 1 in CuS thin films support the formation of covellite CuS phase. FESEM images taken from the surfaces of chemically deposited nanocrystalline CuS thin films shows the dense structure, smooth and relatively void-free surfaces and surface looks well adhered to the glass substrate. The optical band gap was estimated to be in the range between 2.05 eV and 2.15 eV depending on the deposition time. Finally, as a result of the analysis, we can say that the variation in deposition time can affect the structural properties of CuS thin films. |
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List of References |
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