| Authors | A. Shrivastava1 , Guntaj J2 , H. Raju3, , A. Dutt4, A.H. Shnain5, G.V.V. Satyanarayana6, N. Varshney7, P. William8 |
| Affiliations | 1Saveetha School of Engineering, Saveetha Institute of Medical and Technical Sciences, Chennai, Tamilnadu, India 2Centre of Research Impact and Outcome, Chitkara University, Rajpura- 140417, Punjab, India 3New Horizon College of Engineering, Bangalore, India 4Lovely Professional University, Phagwara, India 5Department of Computers Techniques Engineering, College of Technical Engineering, The Islamic University, Najaf, Iraq 6Department of CE, GRIET, Hyderabad, Telangana, 50090, India 7Department of Computer Engineering and Applications, GLA University, Mathura, India 8Department of Information Technology, Sanjivani College of Engineering, Kopargaon, MH, India |
| Е-mail | anuragshri76@gmail.com |
| Issue | Volume 17, Year 2025, Number 6 |
| Dates | Received 10 August 2025; revised manuscript received December 2025; published online December 2025 |
| Citation | A. Shrivastava, [footnoteRef:], Guntaj J, и др., J. Nano- Electron. Phys. 17 No 6, 06030 (2025) |
| DOI | https://doi.org/10.21272/jnep.17(6).06030 |
| PACS Number(s) | 68.55.J –, 73.61.Ph, 88.40.jj |
| Keywords | Substrate Morphology, Electrical Character, Nanostructure (19) , Silicon Solar Cells, Light Absorption Efficiency. |
| Annotation | The morphology of the substrate plays a vital role in determining the electrical performance of nanostructured silicon solar cells (NSiSC) by influencing charge transport dynamics, optical absorption, and surface recombination. The research aims to investigate the influence of different substrate morphologies on the electrical characteristics of NSiSC, including Power Conversion Efficiency (PCE), Short-Circuit Current (SCC), Fill Factor (FF) and open-circuit voltage (Voc). NSiSC was fabricated using substrates with varying surface roughness and textures. Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM) were utilized to characterize surface morphology. X-Ray Diffraction (XRD) analysis was performed to examine crystalline quality and phase composition. Optical reflectance spectra were recorded to evaluate light absorption efficiency. Electrical performance was measured under standard illumination conditions using a solar simulator. The findings reveal a strong correlation between substrate morphology and the electrical properties of the solar cells. Rougher surfaces demonstrated enhanced light trapping, leading to increased SCC density. Compared to planar substrates, nano-patterned surfaces exhibited higher SCC density increased VOC and enhanced PCE. NSiSC-30/150 had the highest PCE (13.5%), with an open-circuit voltage of 529 mV, an FF of 67.5 %, and an SCC of 37.8 mA/cm2. |
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List of References English version of article |