Автори | A.P. Ovcharenko1, V.I. Bilozertseva2, D.A. Gaman2, H.M. Khlyap3, Duong Thi Nhu Tranh1 |
Афіліація | 1 V.N. Karazin Kharkov National University, 4, Svobody Sq., 61022 Kharkiv. Ukraine 2 National Technical University “KPI”, 21, Frunze Str., 61002 Kharkov, Ukraine 3 University of Technology, Fachbereich Physik, 56, E.-Schrödinger Str., D-67663 Kaiserslautern, Germany |
Е-mail | apo@univer.kharkov.ua |
Випуск | Том 5, Рік 2013, Номер 1 |
Дати | Одержано 12.12.2012, опубліковано online - 28.03.2013 |
Цитування | A.P. Ovcharenko, V.I. Bilozertseva, D.A. Gaman, et al., J. Nano- Electron. Phys. 5 No 1, 01010 (2013) |
DOI | |
PACS Number(s) | 42.25.Yz, 42.79.Ci |
Ключові слова | Thin film (101) , Wideband interference coating, Narrow-band interference coating, Refractive indicies. |
Анотація | The paper proposes new approach top the design of wide-band interference filters with suppression adjacent stop-bands. The method of research of the multi-layered interference system, allowing to find the necessary of refractive indices of layers, is presented. The results described in communication open new possibilities for construction and calculation of devices based on thin film materials. |
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