Automated Complex for Thermoresistive Properties Investigation of Nanostructured Film Systems

Authors V.A. Zlenko1, S.I. Protsenko1 , R. Safaric2
Affiliations

1 Sumy State University, 2, Rimsky-Korsakov Str., 40007, Sumy, Ukraine

2 University of Maribor, 17, Smetanova Str., 2000, Maribor, Slovenia

Е-mail [email protected], [email protected]
Issue Volume 1, Year 2009, Number 2
Dates Received 22 September 2009, in final form 30 September 2009
Citation V.A. Zlenko, S.I. Protsenko, R. Safaric, J. Nano- Electron. Phys. 1 No2, 29 (2009)
DOI
PACS Number(s) 68.60.Dv, 73.61. – r, 07.05.Bx, 07.05.Dz
Keywords Thin film (101) , Labview 8.6, Thermal coefficient of resistance.
Annotation
Using industrial controllers of Advantech ADAM-4000 Company and system of graphic programming LabVIEW 8.6 the automated complex for thermoresistive properties investigation of film systems is developed. Approbation of the complex on example of Ni/Fe film system obtained by layered condensation is carried out.

List of References