Authors | Ya.P. Saliy , B.S. Dzundza, I.S. Bylina , O.B. Kostyuk |
Affiliations |
Vasyl Stefanyk PreCarpathian National University 57, Shevchenko St., 76025 Ivano-Frankivsk, Ukraine |
Е-mail | BDzundza@gmail.com |
Issue | Volume 8, Year 2016, Number 2 |
Dates | Received 18 February 2016; published online 21 June 2016 |
Citation | Ya.P. Saliy, B.S. Dzundza, I.S. Bylina, O.B. Kostyuk, J. Nano- Electron. Phys. 8 No 2, 02045 (2016) |
DOI | 10.21272/jnep.8(2).02045 |
PACS Number(s) | 73.50.Lw, 73.63.Bd |
Keywords | Lead telluride, Doping (20) , Thin films (60) , Scattering (20) , Surface (43) . |
Annotation |
The influence of technological factors obtaining: time and temperature of the evaporator and the substrate on the surface morphology and electrical properties of the deposited from the vapor in a vacuum on a substrate of sital films PbTe doped Bi is researched. The atomic force microscopy, image processing methods and Hall research are used. The influence of the shape parameters of surface crystallites on the mobility of free charge carriers is analyzed. |
List of References |