Authors | О.S. Kuzema1 , A.D. Pogrebnjak2 , P.O. Kuzema3 |
Affiliations | 1 Sumy National Agrarian University, 160, Kirov Str., 40021, Sumy, Ukraine 2 Sumy State University, 2, Rimsky-Korsakov St., 40007, Sumy, Ukraine 3 Chuiko Institute of Surface Chemistry of NAS Ukraine, 17, General Naumov Str., 03164, Kyiv, Ukraine |
Е-mail | admin@sau.sumy.ua |
Issue | Volume 2, Year 2010, Number 1 |
Dates | Received 05.11.2009, in final form - 30.03.2010 |
Citation | О.S. Kuzema, A.D. Pogrebnjak, P.O. Kuzema, J. Nano-Electron. Phys. 2 No1, 38 (2010) |
DOI | |
PACS Number(s) | 07.75. + h |
Keywords | Mass analyzer, Ion source, Magnetic field (7) , Electron beam (3) , Resolution. |
Annotation |
The influence of magnetic field focusing the electron beam in ion source of mass spectrometer on the analytical characteristics of the instrument has been studied. The range of current of ion source's focusing electromagnet providing the optimal performance of the mass spectrometer has been determined. |
List of References |