Mechanical Properties of Micron and Nanodimentional Metal Films
| Authors | О.P. Тkach, L.V. Odnodvorets , S.I. Protsenko , D.V. Velykodnyi , К.V. Тyschenko, I.Yu. Protsenko |
| Affiliations | Sumy State University, 2, Rymsky-Korsakov Str., 40007, Sumy, Ukraine |
| Е-mail | protsenko@aph.sumdu.edu.ua |
| Issue | Volume 2, Year 2010, Number 1 |
| Dates | Received 09.04.2010, in final form - 27.04.2010 |
| Citation | О.P. Тkach, L.V. Odnodvorets, S.I. Protsenko, et. al, J. Nano-Electron. Phys. 2 No1, 22 (2010) |
| DOI | |
| PACS Number(s) | 68.60.Dv, 68.65.Ac, 72.10.Fk, 73.50.Lw, 73.61.At, 85.40 |
| Keywords | Mechanical properties (6) , Bulk condensates, Nanodimentional films, Elastic anb plastic deformation. |
| Annotation |
The mechanical and strain resistivity properties data for bulk condensates and nanodimentional films at the elastic and plastic deformation was analyzed. The experimental results of strain resistivity properties of one-layer (Fe, Cr, Pd and Pt) and two-layer (Fe/Cr, Cu/Cr and Pd/Fe) films, in particular, dependence of the deformation at the transition from elastic to plastic deformation from thickness was presented. |
|
List of References |
Other articles from this number
1) Self-Organization in Collective Behaviour of Active Nanoparticles [0-0]2) EHF Dielectrometry of High-Loss Media. Radiation Source, the Interaction Region [006-013]
3) Parametric Analysis of the Liquid-State Objects Images Obtained by gas Discharge Visualization Method [014-021]
4) Simulation of the Formation and Dissociation Processes of Solid Solution in CеO2- La2O3 [030-037]
5) Influence of the Ion Source Operating Conditions on the Characteristics of a Prism Mass Spectrometer With Inhomogeneous Magnetic Field [038-041]
6) Connection of the Hall Coefficient With Some Parameters in Amorphous and Crystalline Ferromagnetics [042-049]
7) Texturation of the Phosphide Indium Surface [050-053]
8) Excitation of Forced Modes in the Dielectric Disk Resonator-Diffraction Grating System [054-057]
9) Algorithms of Coordinates Scintillations Calculation in the Gamma-Camera Detector [0-0]
