Magnetoresistive Properties of Multilayer Film Systems Based on Cu/Fe and Fe/Cr
| Authors | O.V. Synashenko1 , Ch.J. Panchal2, I.Yu. Protsenko1 |
| Affiliations | 1 Sumy State University, 2, Rimsky-Korsakov Str., 40007, Sumy, Ukraine 2 The M. S. University of Baroda, Post Box 51, 390001, Vadodara, Gujarat, India |
| Е-mail | protsenko@aph.sumdu.edu.ua, сjpanchal_msu@yahoo.com |
| Issue | Volume 1, Year 2009, Number 3 |
| Dates | Received in final form 24 July 2009 |
| Citation | O.V. Synashenko, Ch.J. Panchal, I.Yu. Protsenko, J. Nano- Electron. Phys. 1 No3, 13 (2009) |
| DOI | |
| PACS Number(s) | 75.70. – і, 75.70.Cn, 75.75.+а |
| Keywords | Film system, Magnetoresistance (6) , Substrate (12) , Geometry of measurement, Thermal annealing (4) . |
| Annotation |
Magnetoresistive properties of multilayer film systems based on Fe and Cu or Cr were investigated at room temperature. Factors, which influence on the magnetoresistance (MR) value change, were studied. In Fe/Cu film system, in which the individuality of separate layers holds, the substrate change from amorphous pyroceramic to monocrystalline Si(111) leads to the MR ratio increase by 35 %, that is connected with magnetic ordering in bottom epitaxial Fe layer. Thermal annealing of the samples to 700 K leads to vanishing of the odd effect in MR in perpendicular geometry and MR increase by two times in parallel geometries. Investigations of [Fe(dFe)/Cr(1)]10 system showed, that the Fe thickness changes from 0,31 to 1,5 nm, and this leads to the MR magnitude change from 0,03-0,05 % to 1-3 % subject to the different measurement geometries, which is interpreted by Fe granule formation in matrix of solid solution (Fe, Cr). |
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List of References |
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