Authors | B. Srinivasa Rao1, B. Rajesh Kumar2, G. Venkata Chalapathi3, V. Rajagopal Reddy1 , T. Subba Rao2 |
Affiliations | 1 Sri Venkateswara University, Department of Physics, 517502, Tirupati, India 2 Sri Krishnadevaraya University, Department of Physics, 515055, Anantapur, India 3 Loyola Degree College, Department of Physics, 516390, Pulivendula, India |
Е-mail | rajind08@gmail.com |
Issue | Volume 3, Year 2011, Number 1, Part 3 |
Dates | Received 04 February 2011, published online 23 June 2011 |
Citation | B. Srinivasa Rao, B. Rajesh Kumar, G. Venkata Chalapathi, J. Nano- Electron. Phys. 3 No1, 620 (2011) |
DOI | |
PACS Number(s) | 81.05.Dz, 81.20.Ka |
Keywords | II-VI semiconductors (3) , CdS (34) , Nanoparticles (70) , X-ray diffraction (19) , Scanning electron microscopy (16) . |
Annotation |
In the Present work, conventional chemical co-precipitation method was employed for the preparation of Nickel (2, 4, 6, 8 and 10 at % of Ni) doped CdS nanoparticles. The particle size and lattice parameters for each sample are determined from X-ray diffraction (XRD) analysis. From XRD patterns the broadening of the diffraction peaks indicates the nanostructure nature of the samples. Surface morphology of the samples was studied by Scanning Electron Microscope (SEM). Compositional Elemental analysis of data is obtained from Energy Dispersive Analysis of X-ray (EDAX) plots. |
List of References |