Authors | Vinay Kumari1, Vinod Kumar2, B.P. Malik3, Devendra Mohan4, R.M. Mehra5 |
Affiliations | 1 Department of Physics, BMIET, 131 001, Sonepat, India 2 Department of Physics, Gurukula Kangri University, 249 404, Haridwar, India 3 Department of Physics, DCRUST, 131 027, Murthal, India 4 Department of Physics, GJU&ST, 125 001, Hissar, India 5 School of Engineering and Technology, Sharda University, 201 306, Greater Noida, U.P., India |
Е-mail | vinaykhatri76@gmail.com, vinod.phy@gmail.com, drbpmalik@rediffmail.com, vand66@yahoo.com, rammehra2003@yahoo.com |
Issue | Volume 3, Year 2011, Number 1, Part 3 |
Dates | Received 04 February 2011, in final form 18 June 2011, published online 23 June 2011 |
Citation | Vinay Kumari, Vinod Kumar, B.P. Malik, J. Nano- Electron. Phys. 3 No1, 601 (2011) |
DOI | |
PACS Number(s) | 61.72.Uj, 78.20.Ci, 78.30.FS, 78.55.Et |
Keywords | ZnO (92) , Nonlinear absorption, Nonlinear index of refraction, Optical limiting, Nonlinear susceptibility, Z-scan. |
Annotation |
Optical nonlinearities of spin coated ZnO thin film have been investigated by using single beam Z-Scan technique in the visible region. X- ray diffraction shows that all films are oriented along the c-axis direction of the hexagonal crystal structure. The average optical transmittance of all films is higher than 80 %. The nonlinear optical parameters viz. nonlinear absorption coefficient (β), nonlinear index of refraction (η2), nonlinear susceptibility (χ3), have been estimated using nanosecond laser pulses of second harmonic of Nd:YAG Laser. The value of nonlinear absorption coefficient β is estimated to be greater than the already reported value. The films clearly exhibit a-ve value of nonlinear refraction at 532 nm which is attributed to the two photon absorption and free carrier absorption. The presence of RSA in ZnO thin films inferes that ZnO is a potential material for the development of optical limiter. |
List of References |