Calculation of the System Focusing Electron Beam in the Ion Source of Mass Spectrometer with Electron Impact Ionization

Authors О.S. Kuzema1 , P.O. Kuzema2
Affiliations 1 Sumy National Agrarian University, 160, Kirov Str., 40021, Sumy, Ukraine

2 Chuiko institute of surface chemistry of NAS of Ukraine, 17, General Naumov Str., 03164, Kyiv, Ukraine
Е-mail [email protected]
Issue Volume 3, Year 2011, Number 3
Dates Received 31 March 2011, published online 05 November 2011
Citation О.S. Kuzema, P.O. Kuzema, J. Nano- Electron. Phys. 3 No3, 80 (2011)
DOI
PACS Number(s) 07.75.+h
Keywords Mass spectrometer, Ion source, Ionization chamber, Magnetic field (7) , Electron Beam (3) .
Annotation
It has been found the correlations for the parameters of electron movement and it has been determined the value for magnetic induction in the region of ionization chamber providing the electron beam passage through the space of ionization chamber without its broadening.

List of References