Automated Complex for Thermoresistive Properties Investigation of Nanostructured Film Systems
| Authors | V.A. Zlenko1, S.I. Protsenko1 , R. Safaric2 |
| Affiliations | 1 Sumy State University, 2, Rimsky-Korsakov Str., 40007, Sumy, Ukraine 2 University of Maribor, 17, Smetanova Str., 2000, Maribor, Slovenia |
| Е-mail | serhiy.protsenko@elit.sumdu.edu.ua, riko.safaric@uni-mb.si |
| Issue | Volume 1, Year 2009, Number 2 |
| Dates | Received 22 September 2009, in final form 30 September 2009 |
| Citation | V.A. Zlenko, S.I. Protsenko, R. Safaric, J. Nano- Electron. Phys. 1 No2, 29 (2009) |
| DOI | |
| PACS Number(s) | 68.60.Dv, 73.61. – r, 07.05.Bx, 07.05.Dz |
| Keywords | Thin film (101) , Labview 8.6, Thermal coefficient of resistance. |
| Annotation |
Using industrial controllers of Advantech ADAM-4000 Company and system of graphic programming LabVIEW 8.6 the automated complex for thermoresistive properties investigation of film systems is developed. Approbation of the complex on example of Ni/Fe film system obtained by layered condensation is carried out. |
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List of References |
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