Effect of Substrate Temperature on Structural and Morphological Parameters of ZnTe Thin Films

Authors K.D. Patel1 , G.K. Solanki1, C.J. Panchal2 , K.S. Hingarajiya1, J.R. Gandhi1

1 Department of Physics, Sardar Patel University Vallabh Vidyanagar, 388 120, Gujarat, India

2 Faculty of Technology, Applied Physics Department, M.S. University of Baroda, Vadodara 390001, Gujarat, India

Е-mail kdptflspu@yahoo.com
Issue Volume 3, Year 2011, Number 1, Part 1
Dates Received 04 February 2011, in final form 17 March 2011, published online 22 March 2011
Citation K.D. Patel, G.K. Solanki, C.J. Panchal, et al., J. Nano- Electron. Phys. 3 No1, 41 (2011)
PACS Number(s) 68.55 aj, 73.90 + F
Keywords ZnTe thin film, Thermal evaporation (10) , XRD (92) , AFM (18) , Sub-strate temperature.
Annotation Vacuum evaporated thin films of Zinc Telluride (ZnTe) of 5000 Å thickness have been deposited on glass substrates at different substrate temperatures (303 K, 373 K, 448 K). Structural parameters were obtained using XRD analysis. Atomic Force Microscope (AFM) in non-contact mode has been used to study the surface morphological properties of the deposited thin films. The results obtained from structural and surface morphological studies have been correlated and it is found that the films deposited at higher substrate temperatures possess increasingly good crystallinity and smoother surfaces.

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