Results (2):

Title Stress Topology within Silicon Single-Crystal Cantilever Beam
Authors A.P. Kuzmenko, D.I. Timakov, P.V. Abakumov, M.B. Dobromyslov, L.V.Odnodvorets
Issue Volume 5, Year 2013, Number 3
Pages 03024-1 - 03024-5
Title On the Applicability of HF and μ-PCD Methods for Determination of Carrier Recombination Lifetime in the Non-passivated Single-crystal Silicon Samples
Authors I.М. Anfimov, S.P. Kobeleva, I.V. Schemerov, M.N. Orlova
Issue Volume 6, Year 2014, Number 3
Pages 03018-1 - 03018-3