Critical Exponents in Percolation Model of Track Region

Authors A.B. Demchyshyn1, P.O. Selyshchev2

1 Taras Shevchenko National University of Kyiv, Faculty of Physics ,4, Glushkova avenue, 03187, Kyiv, Ukraine

2 University of Pretoria, Department of Physics, Private bag X20 Hatfield 0028, Pretoria, South Africa

Issue Volume 4, Year 2012, Number 1
Dates Received 03 November 2011; published online 14 March 2012
Citation A.B. Demchyshyn, P.O. Selyshchev, J. Nano-Electron. Phys. 4 No 1, 01017 (2012)
PACS Number(s) 1.72. – y,
Keywords Track (3) , Branched structures, Swift heavy ions (3) , The Monte Carlo method (2) , Critical exponents, Percolation threshold, Percolation.
Annotation Differences between critical exponents of this model and the continuous percolation model indicate that the dependence of the modified structure area on the dose and the angle related with the correlation between individual tracks. It results in next effect: angular dependence of the surface area of the branched structure has maximum value at certain «critical» angle of ions incidence.

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