Synthesis of High Electrical Conductivity of Superconductor NiS Thin Films
| Authors | A. Sbaihi1,2, 3 , S. Benramache2 , C. Benbrika3 |
| Affiliations |
1Laboratoire des Matériaux Semi-Conducteurs et Métalliques, University of Biskra 07000, Algeria 2Laboratoire des Matériaux, des Énergies et de l’Environnement, University of Biskra 07000, Algeria 3Material Sciences Department, Faculty of Science, University of Biskra 07000, Algeria |
| Е-mail | saidbenramache07@gmail.com |
| Issue | Volume 16, Year 2024, Number 1 |
| Dates | Received 12 December 2023; revised manuscript received 20 February 2024; published online 28 February 2024 |
| Citation | A. Sbaihi, S. Benramache, C. Benbrika, J. Nano- Electron. Phys. 16 No 1, 01022 (2024) |
| DOI | https://doi.org/10.21272/jnep.16(1).01022 |
| PACS Number(s) | 74.25.fc |
| Keywords | NiS (17) , Spray pyrolysis (9) , Thin film (101) , X-Ray diffraction (19) . |
| Annotation |
In this work, we prepared and studied the physical properties of nickel sulfide (NiS) nanostructure thin films, which were deposited on heated glasses substrates (T ( 250°C) using the spray pyrolysis technique (SPT)using different Precursor concentrations of these two solution sources: nickel nitrates hyxahydrate {(Ni(NO3)2.6H2O)=X} and thiourea {(CS(NH2)2)=Y}: {30% [X].70%[Y]}, {33%[X].67% [Y]}&{37% [X]. 63 % [Y]} with fixing the other remaining experimental conditions, and this is to understand more the role of the Precursor concentrations of the solutions on the physical properties of nickel sulfide thin films. The results of X-ray diffraction (DRX) analysis showed that all nickel sulfide (NiS) thin films samples are polycrystalline in a hexagonal phase and have a preferred orientation of (010). The Crystallite size (D) was estimated by The Debye–Scherrer’s relation, ranging from 9.915 nm to 22.148 nm. The emergence of the Ni-S bond corresponding to the frequency 668.563 cm – 1 was confirmed by FTIR analysis. On the other hand, the energy of the band gaps varies for samples from 0.87, 0.88 to 0.92 eV. Finally, the Sheet resistance (Rsh) was measured using the four-point method, which it used to determine the conductivity of the samples. |
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List of References |
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