Structural Properties and Elemental Composition of Au+ Implanted ZnO Films, Obtained by Sol-gel Method
| Authors | A.D. Pogrebnjak1 , T.O. Berestok1, 2 , A.S. Opanasyuk1 , Y. Takeda3, K. Oyoshi3, F.F. Komarov4, J. Kassi1 |
| Affiliations | 1 Sumy State University, Rimsky-Korsakov St. 2, 40007 Sumy, Ukraine 2 Catalonia Institute for Energy Research, Jardins de les Dones de Negre St. 1, Sant Adria del Besos, 08930 Barcelona, Spain 3 National Institute for Materials Science, Ibaraki St. 305-0047 Tsukuba, Japan 4 Belarusian State University, Independence Ave 4, 220030 Minsk, Belarus |
| Е-mail | alexp@i.ua, taisia.berestok@ukr.net, opanasyuk_sumdu@ukr.net |
| Issue | Volume 6, Year 2014, Number 2 |
| Dates | Received 30 January 2014; revised manuscript received 06 May 2014; published online 20 June 2014 |
| Citation | A.D. Pogrebnjak, T.O. Berestok , A.S. Opanasyuk, et al., J. Nano- Electron. Phys. 6 No 2, 02003 (2014) |
| DOI | |
| PACS Number(s) | 81.05.Dz, 81.20.Fw |
| Keywords | ZnO : Al, Implantation Au+, Sol-gel method (4) , RBS, Raman investigation. |
| Annotation | The undoped and doped aluminum ZnO films were obtained by sol-gel method onto glass substrates with further implantation of Au+ ions. RBS, XRD methods and Raman spectroscopy were used for films characterization. The XRD analysis showed that obtained samples have a hexagonal structure with lattice constants a 0.3245-0.3249 nm, c 0.5203-0.5204 nm, c / a 1.602-1.603 and growth texture [101]. The values of coherent scattering domains (CSD) were equal to L(201) (13.0-13.9) nm, L(101) (12.0-12.2) nm, L(002) (11.3-12.6) nm. It is found that there is not observed the effects of Au+ implantation on the values of CSD, lattice constants and texture of the films. According to X-ray analysis ions of gold in the films are mainly incorporated in the form of phase of AuZn3. |
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List of References |
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