Generalized Hurst Exponent of The Carbon Thin Film Surface

Автор(ы) V.N. Borisyuk, Jassim Kassi, A.I. Holovchenko
Принадлежность Sumy State University, 2, Rimsky-Korsakov Str., 40007, Sumy, Ukraine
Е-mail vad2@ukr.net
Выпуск Том 3, Год 2011, Номер 4
Даты Received 23 August 2011, published online 30 December 2011
Ссылка V.N. Borisyuk, Jassim Kassi, A.I. Holovchenko, J. Nano- Electron. Phys. 3 No4, 20 (2011)
DOI
PACS Number(s) 05.45.Df, 68.37.Хх
Ключевые слова Self-similarity, Carbon thin films, Hurst exponent, Fractal dimension.
Аннотация
Self-similar structure of the carbon thin film surface, obtained by magnetron sputtering, is investigated numerically. Statistical parameters are calculated within two dimensional multi fractal detrended fluctuation analysis. The numerical model of the surfaces under investigation was build from the SEM images of the carbon thin film. It is shown that the self-similarity in surface structure preserves through different resolutions of the SEM images.

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