Журнал нано- и електронной физики

Properties of Undoped and (Al, In) Doped ZnO Thin Films Prepared by Ultrasonic Spray Pyrolysis for Solar Cell Applications

Автор(ы) A. Djelloul1,2 , Y. Larbah3, M. Adnane1 , B. Labdelli2, M.I. Ziane2, A. Manseri2, A. Messaoud2
Принадлежность

1Département de Technologie des Matériaux, Faculté de Physique, Université des Sciences et de la Technologie d’Oran Mohamed Boudiaf USTO-MB, BP 1505, El M'naouer, 31000 Oran Algérie

2Centre de Recherche en Technologie des Semi-Conducteurs pour l’Energétique ‘CRTSE’, 02 Bd Frantz Fanon, BP 140, 7 Merveilles, Alger, Algérie

3Spectrometry Department, Nuclear Technical Division, Nuclear Research Center of Algiers, 2 Bd., Frantz Fanon, BP 399, Algiers 16000, Algeria

Е-mail djelloulcrtse@gmail.com
Выпуск Том 10, Год 2018, Номер 2
Даты Получено 26.12.2017; в отредактированной форме - 28.04.2018; опубликовано online 29.04.2018
Ссылка A. Djelloul, Y. Larbah, M. Adnane, et al., J. Nano- Electron. Phys. 10 No 2, 02036 (2018)
DOI https://doi.org/10.21272/jnep.10(2).02036
PACS Number(s) 68.55. – a, 73.50. – h, 81.15.Cd, 81.15.Rs
Ключевые слова Zinc oxide (9) , Al doped ZnO, In doped ZnO, Ultrasonic Spray Pyrolysis.
Аннотация

Zinc oxide (ZnO) is an n-type semiconductor with a large optical gap (3.4 eV) belonging to the transparent conductive oxides family (TCO). Strongly present as optical window in the chalcopyrite based structures CIGS and CIS.The structural, morphological, optical and electrical properties of ZnO thin films deposited onto glass substrates by ultrasonic spray pyrolysis (USP) technique have been investigated. For comparison and a better understanding of physical properties of undoped and (Al, In) doped ZnO thin films, a number of techniques, including XRD, SEM, optical absorption method (UV) and four-point probe technique were used to characterize the obtained ZnO thin films. Structural analysis shows that all the films were found to be polycrystalline with a wurtzite structure and show a (1 0 1) preferential growth. Besides, we noted that the preferred orientation does not depend on the nature of dopant. The band gaps (Eg) varied from 3.35 to 3.37 eV by Al and In dopants.

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