| Title |
Investigating the Temperature Effects on ZnO, TiO2, WO3 and HfO2 Based Resistive Random Access Memory (RRAM) Devices |
| Authors |
T.D. Dongale, K.V. Khot, S.V. Mohite, S.S. Khandagale, S.S. Shinde, V.L. Patil, S.A. Vanalkar, A.V. Moholkar, K.Y. Rajpure, P.N. Bhosale, P.S. Patil, P.K. Gaikwad, R.K. Kamat |
| Issue |
Volume 8, Year 2016, Number 4 |
| Pages |
04030-1 - 04030-4 |
| Title |
Effect of Conductive Filament Temperature on ZrO2 based Resistive Random Access Memory Devices |
| Authors |
Pramod J. Patil, Namita A. Ahir, Suhas Yadav, Chetan C. Revadekar, Kishorkumar V. Khot, Rajanish K. Kamat, Tukaram D. Dongale, Deok-kee Kim |
| Issue |
Volume 12, Year 2020, Number 2 |
| Pages |
02008-1 - 02008-4 |
