| Title | Ellipsometric Characterization of SiO2/Au/Cr Nanostructures for Stable SPR Sensors | |
| Authors | I. Minailova, O. Ivakhno-Tsehelnyk, P. Shamrovska, A. Fedorenko, N. Kachur, I. Matyash, V. Maslov, D.R.T. Zhan | |
| Issue | Volume 18, Year 2026, Number 3 | |
| Pages | 03011-1 - 03011-5 | |
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